Preview
Sign-in for full Details 
Sign-in free and Explore the Exciting World of BiomedExperts:
- Over 1.500.000 Profiles
- More than 1.800 Organizations worldwide
- State of the Art Network Visualizations
- Manage your own Profile
- Locate Experts in your Country/Region
- Locate Experts in your 1. and 2. Level Network
- Connect to Experts Worldwide
NetworkView
Experts in Electron Microscopy
Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
- de Souza, Wanderley
- Trump, BF
- Ellisman, Mark
- Tay, Franklin Chi Meng
- Pickel, Virginia
- Chiu, Wah
- Hirano, Asao
- Green, Richard
- Pashley, David
- Dvorak, Ann
- Aebi, Ueli
- Palade, GE
- Boekema, Egbert
- Steven, Alasdair
- Baumeister, Wolfgang
- Griffith, Jack
- Wisniewski, Henryk
- Eyden, Brian
- Carrascosa, José
- Egelman, Edward
- Ong, Wei-Yi
- Ling, Eng-Ang
- Milner, Teresa
- Hermo, Louis
- Ottersen, Ole Petter
- Parton, Robert
- Baccetti, Baccio
- Craig, Roger
- Gajkowska, Barbara
- Baker, Timothy