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Experts in Electron Probe Microanalysis
Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
- Roomans, Godfried
- Dörge, Adolf
- Campos, Antonio
- Eliades, George
- Beck, Franz-X
- Hagler, Herbert
- LoPachin, Richard
- Höhling, HJ
- Krefting, Ernst Rudolf
- Werner, Liliana
- Eliades, Theodore
- Leapman, Richard
- Debari, Kazuhiro
- Kokubo, Tadashi
- Pogorelov, Alexander
- Zinelis, Spiros
- Crespo, Pascual
- Apple, David
- Cameron, Ivan
- Kodaka, Tetsuo
- Paoletti, Luigi
- Bond, Meredith
- Brantley, William
- Buja, Maximilian
- Cañizares, Francisco
- Mamalis, Nick
- Ratner, Buddy
- Reim, Martin
- Schrage, Norbert
- Van Grieken, René
